Top 100 scientists can be ranked globally or specific to the following regions including Africa, Asia, Europe, North America, Latin America, Oceania, Arab League, ASEAN, EECA, and BRICS based on total H-index scores without any breakdown by subject areas. Top 100 rankings in the world, in a continent, or a region include standardized subjects areas of Agriculture & Forestry, Arts, Design and Architecture, Business & Management, Economics & Econometrics, Education, Engineering & Technology, History, Philosophy, Theology, Law/Law and Legal Studies, Medical and Health Sciences, Natural Sciences, Social Sciences, Art and Humanities Rankings and Social Sciences and Humanities Rankings BETA VERSION. Subject field ranking in world, region, country and university is beta version since subject field "others" (873,690 scientists profile whose branch cannot be determined, not yet edited or determined) is excluded, so the ranking will change as the others fields are edited. Please note that. Subjects indicated as “ * others ” will not be included in the ranking by regions and subjects.
Metrics
H-Index
i10 Index
Citation
43
124
6,959
Semiconductor Technology and Device Integration
Metrics
H-Index
i10 Index
Citation
42
71
14,893
Semiconductors
Atomic Layer Deposition
High-k Gate Dielectrics
Plasma Deposition
Thermal Deposition
Metrics
H-Index
i10 Index
Citation
34
54
9,455
Metrics
H-Index
i10 Index
Citation
24
35
7,508
thin film
Metrics
H-Index
i10 Index
Citation
23
35
1,489
Materials Chemistry
Thin Films
ALD
Surface Chemistry
Lab and Synchrotron Based X-ray Characterization
Metrics
H-Index
i10 Index
Citation
21
31
1,245
Metrics
H-Index
i10 Index
Citation
20
23
1,444
Semicon thin film process
Renewable energy
Supercapacitor
Nano materials
Thin film transistor
Metrics
H-Index
i10 Index
Citation
20
31
5,389
Atomic Layer Deposition
Metrics
H-Index
i10 Index
Citation
19
24
2,554
* Rankings
Ranking Based
On Selection: 10
Microelectronics & Nanotechnologies
Metrics
H-Index
i10 Index
Citation
17
25
2,282
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* Rankings
Ranking Based
On Selection: 11
Atomic layer deposition
initiated chemical vapor deposition
Metrics
H-Index
i10 Index
Citation
17
18
1,214
* Rankings
Ranking Based
On Selection: 12
Materials Science
Thin Films
Thermoelectrics
Energy
Metrics
H-Index
i10 Index
Citation
14
14
1,157
* Rankings
Ranking Based
On Selection: 13
Metrics
H-Index
i10 Index
Citation
14
14
775
* Rankings
Ranking Based
On Selection: 14
Metrics
H-Index
i10 Index
Citation
14
17
912
* Rankings
Ranking Based
On Selection: 15
Semiconductor Process/Process Integration Technology (3D NAND and Logic
BEOL)
micro-LED Fabrication
Metrics
H-Index
i10 Index
Citation
14
15
799
* Rankings
Ranking Based
On Selection: 16
Metrics
H-Index
i10 Index
Citation
14
14
791
* Rankings
Ranking Based
On Selection: 17
OSCs
Ferroelectrics
Ultra high k materials
2D material
Metrics
H-Index
i10 Index
Citation
13
17
575
* Rankings
Ranking Based
On Selection: 18
ALD
Epitaxy
Metrics
H-Index
i10 Index
Citation
13
16
3,206
* Rankings
Ranking Based
On Selection: 19
Atomic layer deposition
Plasma processing
Metrics
H-Index
i10 Index
Citation
13
15
1,201
* Rankings
Ranking Based
On Selection: 20
Atomic Layer Deposition and applications
Metrics
H-Index
i10 Index
Citation
12
14
647
* Rankings
Ranking Based
On Selection: 21
Metrics
H-Index
i10 Index
Citation
11
13
476
* Rankings
Ranking Based
On Selection: 22
ALD
Metrics
H-Index
i10 Index
Citation
10
11
697
* Rankings
Ranking Based
On Selection: 23
Material Chemistry
Nano Structure
Thin Film Processing
Microscopy
Metrics
H-Index
i10 Index
Citation
10
10
279
* Rankings
Ranking Based
On Selection: 24
Nano materials
MOSFET
PEALD
Metrics
H-Index
i10 Index
Citation
9
9
641
* Rankings
Ranking Based
On Selection: 25
Metrics
H-Index
i10 Index
Citation
9
9
499
* Rankings
Ranking Based
On Selection: 26
Mechanical Engineering
Materials Science
Metrics
H-Index
i10 Index
Citation
9
9
399
* Rankings
Ranking Based
On Selection: 27
ALD
ALE
Surface chemistry
2D materials
semiconductor devices
Metrics
H-Index
i10 Index
Citation
8
8
268
* Rankings
Ranking Based
On Selection: 28
Metrics
H-Index
i10 Index
Citation
8
7
218
* Rankings
Ranking Based
On Selection: 29
Metrics
H-Index
i10 Index
Citation
8
7
479
* Rankings
Ranking Based
On Selection: 30
Metrics
H-Index
i10 Index
Citation
7
6
381
* Rankings
Ranking Based
On Selection: 31
Atomic Layer Deposition
Magnetism
Memory
Metrics
H-Index
i10 Index
Citation
7
5
141
* Rankings
Ranking Based
On Selection: 32
Etching
Compound Semiconductor
Low-k materials
Thin films
PECVD
Metrics
H-Index
i10 Index
Citation
7
7
121
* Rankings
Ranking Based
On Selection: 33
III-V semiconductors
optical filters
chemical vapor deposition
atomic layer deposition
Metrics
H-Index
i10 Index
Citation
6
6
214
* Rankings
Ranking Based
On Selection: 34
Epitaxial growth of semiconductors
Material characterization
Electronic devices
Optoelectronic
Metrics
H-Index
i10 Index
Citation
6
4
147
* Rankings
Ranking Based
On Selection: 35
Epitaxy
CVD
ALD
HARC Dielectric Etch
XPS.
Metrics
H-Index
i10 Index
Citation
6
4
185
* Rankings
Ranking Based
On Selection: 36
Nanotechnology
Material Science
Semiconductors
Metrics
H-Index
i10 Index
Citation
5
4
183
* Rankings
Ranking Based
On Selection: 37
Metrics
H-Index
i10 Index
Citation
5
4
227
* Rankings
Ranking Based
On Selection: 38
Metrics
H-Index
i10 Index
Citation
5
4
81
* Rankings
Ranking Based
On Selection: 39
Semiconductors
PEALD
Thermal ALD
Epitaxy
Metrics
H-Index
i10 Index
Citation
3
1
29
* Rankings
Ranking Based
On Selection: 40
Nanotechnology
Materials Science
Microelectronics And Semiconductor Engineering
Metrics
H-Index
i10 Index
Citation
3
2
73
* Rankings
Ranking Based
On Selection: 41
Artificial Intelligence
Computational Neuroscience
Metrics
H-Index
i10 Index
Citation
1
0
6
Vamsi Paruchuri
ASM International
Almere, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
43
124
6,959
Michael E. Givens
ASM International
Almere, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
42
71
14,893
Shankar Swaminathan
ASM International
Almere, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
34
54
9,455
Semiconductors
Atomic Layer Deposition
High-k Gate Dielectrics
Plasma Deposition
Thermal Deposition
Chiyu Zhu
ASM International
Almere, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
24
35
7,508
Andrea Illiberi
ASM International
Almere, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
23
35
1,489
Ranjith K. Ramachandran
ASM International
Almere, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
21
31
1,245
Materials Chemistry
Thin Films
ALD
Surface Chemistry
Lab and Synchrotron Based X-ray Characterization
Mikas Remeika
ASM International
Almere, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
20
23
1,444
Hyuck Lim
ASM International
Almere, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
20
31
5,389
Semicon thin film process
Renewable energy
Supercapacitor
Nano materials
Thin film transistor
Delphine Longrie
ASM International
Almere, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
19
24
2,554
Andrey Shchepetov
ASM International
Almere, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
17
25
2,282
Microelectronics & Nanotechnologies
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Do Han Kim
ASM International
Almere, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
17
18
1,214
Tommi Tynell
ASM International
Almere, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
14
14
1,157
Materials Science
Thin Films
Thermoelectrics
Energy
René Hj Vervuurt
ASM International
Almere, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
14
14
775
Shibesh Dutta
ASM International
Almere, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
14
17
912
Debanjan Jana
ASM International
Almere, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
14
15
799
Semiconductor Process/Process Integration Technology (3D NAND and Logic
BEOL)
micro-LED Fabrication
Yoann Tomczak
ASM International
Almere, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
14
14
791
Alessandra Leonhardt
ASM International
Almere, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
13
17
575
OSCs
Ferroelectrics
Ultra high k materials
2D material
Krzysztof Kachel
ASM International
Almere, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
13
16
3,206
Shuaidi Zhang
ASM International
Almere, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
13
15
1,201
Devika Choudhury
ASM International
Almere, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
12
14
647
Youngchol Byun
ASM International
Almere, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
11
13
476
Joseph R. Nasr
ASM International
Almere, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
10
11
697
Material Chemistry
Nano Structure
Thin Film Processing
Microscopy
Nano materials
MOSFET
PEALD
Kwang-Seok Ahn
ASM International
Almere, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
9
9
499
Mechanical Engineering
Materials Science
Petro Deminskyi
ASM International
Almere, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
8
8
268
ALD
ALE
Surface chemistry
2D materials
semiconductor devices
Lutz Muehlenbein
ASM International
Almere, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
8
7
218
Ville Liimatainen
ASM International
Almere, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
8
7
479
Sidharth Reddy Karnati
ASM International
Almere, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
7
6
381
Bart Vermeulen
ASM International
Almere, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
7
5
141
Robinson James
ASM International
Almere, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
7
7
121
Etching
Compound Semiconductor
Low-k materials
Thin films
PECVD
Rochelle Lee
ASM International
Almere, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
6
6
214
III-V semiconductors
optical filters
chemical vapor deposition
atomic layer deposition
Abheek Bardhan
ASM International
Almere, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
6
4
147
Epitaxial growth of semiconductors
Material characterization
Electronic devices
Optoelectronic
Theodore J Kraus
ASM International
Almere, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
6
4
185
Nanotechnology
Material Science
Semiconductors
Davide Proserpio
ASM International
Almere, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
5
4
227
De Guzmán-Caballero
ASM International
Almere, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
5
4
81
Chandra Nannuri
ASM International
Almere, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
3
1
29
Nanotechnology
Materials Science
Microelectronics And Semiconductor Engineering
Padraic Edgington
ASM International
Almere, Netherlands
Metrics
H-Index
i10 Index
Citation Counts
1
0
6
Artificial Intelligence
Computational Neuroscience